128 Series
<p>Silicon Concepts is the leading manufacturer of stress measurement tools for semiconductor, MEMS, optoelectronic, and flat panel applications. Stress and wafer bow maps can be acquired over the entire wafer surface, providing process engineers means to characterize and develop new processes using different thin film materials.</p>
<p><span style="line-height: 1.6em;">The SIC 128 Series systems are room temperature, full-wafer 2D/3D stress mapping systems. 128 systems use SIC's patented non-contact Opti-Lever dual-laser auto-switching technology. Ability to scan 1000 points per inch in seconds for high resolution, high precision stress mapping on blanked and patterned wafers.</span></p>
Models: 128L C2C | 128L | 128NT | 128G-450 | 128 C2C |
<p><span style="line-height: 1.6em;">The SIC 128 Series systems are room temperature, full-wafer 2D/3D stress mapping systems. 128 systems use SIC's patented non-contact Opti-Lever dual-laser auto-switching technology. Ability to scan 1000 points per inch in seconds for high resolution, high precision stress mapping on blanked and patterned wafers.</span></p>
Models: 128L C2C | 128L | 128NT | 128G-450 | 128 C2C |
